Scanning probe microscopy, also known as atomic force microscopy (AFM), is a powerful method for nano-meter scale imaging of sample surfaces. The system uses a micro-machined cantilever with a sharp tip on its edge which scans over a sample. The deflection of the cantilever is measured by casting a laser beam onto the cantilever’s backside and then detecting the reflected beam with a position sensitive photo detector. A feedback loop controlling a distinct scanner along the z-axis allows to follow the topography of the sample surface.

There are two AFM instruments available at the lab.

JPK Nanowizard 3 Ultra S

Specifications can be seen in the official brochure by JPK:
http://usa.jpk.com/jpk-nanowizard-ultraspeed-a-15-2.download.4271dba5a9d1cfc3895ca1e311def62f

Images

Setup

Scanning in liquid

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PSIA XE-100

Specifications of the PSIA XE-100® scanning probe microscope (SPM) that is available at the laboratory:

The XE-100 on the Park Systems Homepage

Images

PSIA XE-100

Osteonal lamellae scan